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00:42:13
Keynote: Ronnie Vasishta, NVIDIA - B6GS 2025
00:57:55
Panel discussion: U.S. Academic View on 6G - B6GS 2025
00:24:38
Starting Logitech by Daniel Borel
00:21:43
Data-Driven Strategies for Sustainable EV Charging and Grid Integration
00:53:18
Building Trustworthy Robots: A Practical Playbook for Security, Privacy & Risk
00:39:27
Keynote: Yago Tenorio, Verizon - B6GS 2025
00:26:17
Nokia Fireside Chat - 6Gs Role in the AI Supercycle - B6GS 2025
00:07:52
Welcome Address - B6GS 2025
00:48:45
IEEE AI Coalition: HPC and Its Influence on Accelerating Low-Code and AI Transformation in Healthcare
00:35:41
Scalable X-Ray Characterization for Device Reliability and Failure Analysis
00:26:03
New HALT with Physics of Failure (PoF) for Electronics
00:32:42
Types of Environmental Testing with an In-Depth Look at Skewed Fixture for HALT
00:22:24
Analysis of Depolarization and the Fundamental Advantage of Mueller Matrix Ellipsometry for Thin Film Metrology
00:19:42
Apex-Hybrid: An Advanced X-ray Imaging System with Dual-Mode Imaging Modality
00:16:52
Physical Understanding of Bleed from Thermal Interfaces
00:23:38
Quantifying Burn-In of Phase Change Thermal Interface Materials
00:24:50
IMS Printed Circuit Board Solder Fatigue Validation
00:28:14
Short- and Long-Term Stability of NTC Chip-Scale Thermistors
00:22:37
Perturbation of the Electrostatic Potential distribution in HV-ICs Induced by Space Charge in Epoxy Packaging
00:28:47
Development of Standardized and Scalable Glass-based Technology for the Next-generation Electronic-Photonic Systems in a Package
00:30:05
Reliability Optimization of Open Trench Undercuts Silicon Photonic Tuner Heater
00:28:21
Metrology Challenges in Advanced Packaging: Focus on Die-to-Die and Die-to-Wafer Bonding
00:14:55
Strategic LLM Routing: Business Rules for AI Model Selection
01:56:45
Sensing the Pulse of a Data Stream in Real Time: An IEEE Day Event
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