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IMS 2011 Microapps - Pulsed S-Parameter Measurements Using PXI Instruments

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#IMS #2011 International Microwave Symposium #MicroApps #Pulsed SParameter Measurements using PXI Istruments #presented by David Broadbent #Product Manager #RF Wireless Test

IMS 2011 MicroApps- " Pulsed S-Parameter Measurements using PXI Instruments," presented by David Broadbent, Product Manager, RF & Wireless Test.

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