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Microwave Journal Panel Session Path to 5G - Design and Test Challenges - MicroApps IMS 2015

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Microwave Journal Panel Session Path to 5G
Design and Test Challenges

Moderated by Eric Higham, Strategy Analytics

This lively discussion features Rogers Nichols, Keysight Technologies, Inc.; Jin Bains, National Instruments; Andreas Roessler, Rohde & Schwarz, Inc.; Mark Cloutier, Analog Devices, Inc.; David Ryan, MACOM, Inc.

Organizer Pat Hindle, Microwave Journal

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