IMS 2011 Microapps - Waveguide Characteristics and Measurement Errors 688 views Download Download IEEE.tv is made possible by the Members of IEEE. This feature is accessible to IEEE Members only, with an IEEE Account. If you are an IEEE Member please sign in to enable this feature. In addition to exclusive access to IEEE.tv programming, IEEE members have file download, and can save favorite videos with myTV. Discover all the benefits of IEEE membership! Belong to the world's largest technical proffecional society Join / Renew Today Share Embed Static Responsive <iframe src="//ieeetvdev.ieee.org/player/embed_play/127775/auto" allowfullscreen frameborder="0" scrolling="no" width="100%"></iframe> Size: x <iframe src="//ieeetvdev.ieee.org/player/embed_play/127775/auto" allowfullscreen frameborder="0" scrolling="no" width="760" height="430" ></iframe> Copy Close +0 MTT-S (IMS) 2-SID-3 Conference Highlights Series 11-All Programs Series 13-Public Videos IEEE Microwave Theory and Techniques Society Create Account or Sign In to post comments #IMS #2011 International Microwave Symposium #MicroApps #Waveguide Characteristics and Measurement Errors #Keith Anderson #Agilent Technologies IMS 2011 MicroApps- "Waveguide Characteristics and Measurement Errors," presented by Keith Anderson, Agilent Technologies. June 24, 2011
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