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01:19:53
The Origins of Silicon Valley: Characteristics of a Startup Environment
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Showing 23 - 44 of 289
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From Elastic Expansion to Cu Bulge-Out: Mechanisms, Measurements, and Modeling for Sub-Micron Hybrid Bonding
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Abrasive-Free Polymer Chemical–Mechanical Polishing for PI/Cu Hybrid Bonding: High-Rate Removal and an Atomistic Mechanism from Neural-Network-Potential Molecular Dynamics
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Technology of Cleaning and Activation Using Surface Wave Excited Plasma Downstream for Hybrid Bonding
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Hybrid Bonding Symposium: Panel - Enabling Hybrid Bonding Proliferation
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Challenges and Impact of Surface Properties on Wafer-level Hybrid Bonding Process for Industrial Application
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Recent Advances and Trends in Hybrid Bonding
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Characterization and Application of a New Chip-Level Air Pump
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Scalable X-Ray Characterization for Device Reliability and Failure Analysis
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New HALT with Physics of Failure (PoF) for Electronics
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Types of Environmental Testing with an In-Depth Look at Skewed Fixture for HALT
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00:22:24
Analysis of Depolarization and the Fundamental Advantage of Mueller Matrix Ellipsometry for Thin Film Metrology
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Apex-Hybrid: An Advanced X-ray Imaging System with Dual-Mode Imaging Modality
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Physical Understanding of Bleed from Thermal Interfaces
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Quantifying Burn-In of Phase Change Thermal Interface Materials
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IMS Printed Circuit Board Solder Fatigue Validation
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Short- and Long-Term Stability of NTC Chip-Scale Thermistors
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Perturbation of the Electrostatic Potential distribution in HV-ICs Induced by Space Charge in Epoxy Packaging
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Development of Standardized and Scalable Glass-based Technology for the Next-generation Electronic-Photonic Systems in a Package
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Reliability Optimization of Open Trench Undercuts Silicon Photonic Tuner Heater
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Metrology Challenges in Advanced Packaging: Focus on Die-to-Die and Die-to-Wafer Bonding
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Analytical Modeling of Thermal Stress in Cu TSVs Incorporating Grain Orientation Anisotropy
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00:27:23
Heterogeneous Packaging for Data Center Applications
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